In this paper, we describe an easy-to-use method to measure the thermal conductivity of thin films based on an electrical heating/sensing mechanism and a steady-state technique. The method used relative commonly used instruments, and without any signal processing circuit, is easy to be used in such thin-film thermal conductivity measurement. The SiO2 thin-film samples, prepared by thermal oxidation, plasma enhanced chemical vapor deposition (PECVD), and E-beam evaporator, were deposited on a silicon substrate. The apparent thermal conductivity, the intrinsic thermal conductivity of SiO2 films, and the total interface thermal resistance of the heater/SiO2/silicon system were evaluated. Our data showed agreement with those data obtained from previous literatures and from the 3 omega method. Furthermore, by using a sandwiched structure, the interface thermal resistance of Cr/PECVD SiO2 and PECVD SiO2/silicon were also separately evaluated in this work. The data showed that the interface thermal resistance of Cr/PECVD SiO2 (metal/dielectric) is about one order of magnitude larger than that of PECVD SiO2/silicon (dielectric/dielectric).
Correlations of the vorticity and the passive material line element with strains in decaying turbulence are investigated. The mean principal rates of the strain and the growth rates of the vorticity and the material line element due to the nonlinear stretching are all found to be proportional to the square-root-mean enstrophy. The ratios of the principal rates are 4:1:Ϫ5. It is shown how these ratios help determining the values of free parameters in the phenomenological models of turbulence such as the Burgers vortex model proposed by Ashurst ͑private communication͒ and the Lundgren-Townsend vortex model by Pullin and Saffman ͓Phys. Fluids A 5, 126 ͑1993͒; 6, 3010 ͑1994͔͒. The mean growth rate of material line elements is slightly larger than the intermediate principal rate, but much less than the most positive one. Numerical results show that the material line element has nearly the same preferences in aligning with the principal directions of the strain corresponding to the mostly positive and the intermediate principal rates. The growth rate is approximately linearly correlated with the strain magnitude but almost uncorrelated with the vorticity magnitude. Conditional statistics and a simple model flow have been used to explain the above observations.
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