Insights into the micro- and nano-architecture of materials is crucial for understanding and predicting their macroscopic behaviour. In particular, for emerging applications such as meta-materials, the micrometer scale becomes highly relevant. The micro-architecture of such materials can be tailored to exhibit specific mechanical, optical or electromagnetic behaviours. Consequently, quality control at micrometer scale must be guaranteed over extended areas. Mesoscale investigations over millimetre sized areas can be performed by scanning small angle X-ray scattering methods (SAXS). However, due to their long measurement times, real time or operando investigations are hindered. Here we present a method based on X-ray diffractive optics that enables the acquisition of SAXS signals in a single shot (few milliseconds) over extended areas. This method is applicable to a wide range of X-ray sources with varying levels of spatial coherence and monochromaticity, as demonstrated from the experimental results. This enables a scalable solution of spatially resolved SAXS.

X-ray grating interferometry is a promising imaging technique sensitive to attenuation, refraction and scattering of the radiation. Applications of this technique in the energy range between 80 and 150 keV pose severe technical challenges, and are still mostly unexplored. Phase-contrast X-ray imaging at such high energies is of relevant scientific and industrial interest, in particular for the investigation of strongly absorbing or thick materials as well as for medical imaging. Here we show the successful implementation of a Talbot-Lau interferometer operated at 100 keV using a conventional X-ray tube and a compact geometry, with a total length of 54 cm. We present the edge-on illumination of the gratings in order to overcome the current fabrication limits. Finally, the curved structures match the beam divergence and allow a large field of view on a short and efficient setup.