The electronics industry has heavily prioritized enhancing the quality, lifetime and conforming rate (conforming to specifications) of electronic components. Various methods have been developed for assessing quality performance. In practice, process capability indices (PCIs) are used as a means of measuring process potential and performance. Moreover, most PCIs have been developed or investigated under the assumption that electronic components have a lifetime with a normal distribution. However, PCIs for non‐normal distributions have seldom been discussed. Nevertheless, the lifetime of electronic components generally may possess an exponential, gamma or Weibull distribution and so forth. Under an exponential distribution, some properties of the PCIs and their estimators differ from those in a normal distribution. To utilize the PCIs more reasonably and accurately in assessing the lifetime performance of electronic components, this study constructs a uniformly minimum variance unbiased (UMVU) estimator of their lifetime performance index under an exponential distribution. The UMVU estimator of the lifetime performance index is then utilized to develop the hypothesis testing procedure. The purchasers can then employ the testing procedure to determine whether the lifetime of the electronic components adheres to the required level. Manufacturers can also utilize this procedure to enhance process capability.
Process capability indices can be viewed as convenient and excellent tools to measure and define process output. Several capability indices including Cp, Cpu, Cpl, Cpk, Cpm and Cpp have been widely used in manufacturing industry to provide common quantitative measures on process potentials and performance. Process capability inex Cpp can be used to measure product capability with respect to process targeting. “The larger the better” is the general rule for the application of process capability indices Cp, Cpu, Cpl, Cpk and Cpm. However, those researchers take accounts for processes with single quality characteristics only and cannot be applied to a product family with different models, types or sizes simultaneously. the approach of this paper is to propose a concise and applicable methodology that measures the entire process capability of a product family with several models. For convenient and practical application to product engineers, a simple procedure of hypothesis test for entire process capability of a PVC pipe product familiy is well established.
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