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Broadband dielectric spectroscopy (BDS), spectroscopic vis-ellipsometry (SE), X-ray reflectometry (XRR), and alternating current (ACC) as well as differential scanning calorimetry (DSC) are combined to study glassy dynamics and the glass transition in nanometric thin (≥5 nm) layers of polystyrene (PS) having widely varying molecular weights (27 500−8 090 000 g/mol). For the dielectric measurements two sample geometries are employed, the common technique using evaporated electrodes and a recently developed approach taking advantage of nanostructures as spacers. All applied methods deliver the concurring result that deviations from glassy dynamics and from the glass transition of the bulk do not exceed margins of ±3 K independent of the layer thickness and the molecular weight of the polymer under study. Our findings are discussed in the context of the highly controversial literature and prove that an appropriate sample preparation is of paramount importance.

Abstract. This paper describes the theory and the algorithm to be used in producing a global bidirectional reflectance distribution function (BRDF) and albedo product from data to be acquired by the moderate resolution imaging spectroradiometer (MODIS) and the multiangle imaging spectroradiometer (MISR), both to be launched in 1998 on the AM-1 satellite platform as part of NASA's Earth Observing System (EOS). The product will be derived using the kernel-driven semiempirical Ambrals BRDF model, utilizing five variants of kernel functions characterizing isotropic, volume and surface scattering. The BRDF and the albedo of each pixel of the land surface will be modeled at a spatial resolution of 1 km and once every 16 days in seven spectral bands spanning the visible and the near infrared. The BRDF parameters retrieved and recorded in the MODIS BRDF/albedo product will be intrinsic surface properties decoupled from the prevailing atmospheric state and hence suited for a wide range of applications requiting characterization of the directional anisotropy of Earth surface reflectance. A set of quality control flags accompanies the product. An initial validation of the Ambrals model is demonstrated using a variety of field-measured data sets for several different land cover types.

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