Access and use of this website and the material on it are subject to the Terms and Conditions set forth at Vous avez des questions? Nous pouvons vous aider. Pour communiquer directement avec un auteur, consultez la première page de la revue dans laquelle son article a été publié afin de trouver ses coordonnées. Si vous n'arrivez pas à les repérer, communiquez avec nous à PublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. Questions? Contact the NRC Publications Archive team atPublicationsArchive-ArchivesPublications@nrc-cnrc.gc.ca. If you wish to email the authors directly, please see the first page of the publication for their contact information. NRC Publications Archive Archives des publications du CNRCThis publication could be one of several versions: author's original, accepted manuscript or the publisher's version. / La version de cette publication peut être l'une des suivantes : la version prépublication de l'auteur, la version acceptée du manuscrit ou la version de l'éditeur. For the publisher's version, please access the DOI link below./ Pour consulter la version de l'éditeur, utilisez le lien DOI ci-dessous.http://doi.org/10.1063/1.3240595Applied physics letters, 95, 13, 2009 Photoluminescence and Raman scattering in axial Si/Ge nanowire heterojunctions In crystalline, dislocation-free, Si/Ge nanowire axial heterojunctions grown using the vapor-liquid-solid technique, photoluminescence and Raman spectroscopy reveal a SiGe alloy transition layer with preferential chemical composition and strain. In addition to the lattice mismatch, strain in Si/Ge nanowires is observed from a temperature dependent study to be affected by the difference in Si and Ge thermal expansion. The conclusions are supported by analytical transmission electron microscopy measurements.
Si/Ge core-shell nanowires, which possess uniform diameters around 100 nm, were synthesized at low temperature using a chemical vapor deposition process. The radial structures of Si/Ge nanowires were investigated via cross-sectional transmission electron microscopy analysis. The data from energy dispersive x-ray spectroscopy confirmed the coaxial structures of our nanowires, which consistently determined the core to be polycrystalline Si and the shell to be crystalline Ge. The optical properties of Si/Ge core-shell nanowires were also discussed from Raman measurement. The method presented in this study will allow efficient fabrication of core-shell nanostructures and may be promising for future device application.
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