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Automatic depression assessment based on visual cues is a rapidly growing research domain. The present exhaustive review of existing approaches as reported in over sixty publications during the last ten years focuses on image processing and machine learning algorithms. Visual manifestations of depression, various procedures used for data collection, and existing datasets are summarized. The review outlines methods and algorithms for visual feature extraction, dimensionality reduction, decision methods for classification and regression approaches, as well as different fusion strategies. A quantitative meta-analysis of reported results, relying on performance metrics robust to chance, is included, identifying general trends and key unresolved issues to be considered in future studies of automatic depression assessment utilizing visual cues alone or in combination with vocal or verbal cues.

This paper aims to explore RLC equivalent circuit synthesis method for reduced-order models of interconnect circuits obtained by Krylov subspace based model order reduction (MOR) methods. To guarantee pure RLC equivalent circuits can be synthesized for the reduced-order models, both the structures of input and output incidence matrices and the block structure of the circuit matrices should be preserved in the reduced-order models. Block structure preserving MOR methods such as SPRIM [1] and SAPOR [2] have been well established. In this paper, we propose an embeddable Input-Output structure Preserving Order Reduction (IOPOR) technique to further preserve the structures of input and output incidence matrices in the reduced-order models. By combining block structure preserving MOR methods and IOPOR technique, we develop an RLC equivalent circuit synthesis method RLCSYN (RLC SYNthesis). Inline diagonalization and regularization techniques are specifically proposed to enhance the robustness of inductance synthesis. The pure RLC model, high modeling accuracy, passivity guaranteed property and SPICE simulation robustness make RLCSYN more applicable in interconnect analysis, either for digital IC design or mixed signal IC simulation.