Ion mobility spectrometers (IMS) are compact devices for extremely sensitive detection of proton and electron affine volatile compounds down to low ppt concentrations within less than a second. The measuring principle requires ionization of the target analyte. Most IMS employ radioactive electron sources, such as Ni orH. These radioactive materials suffer from legal restrictions limiting the fields of application. Furthermore, the electron emission has a predetermined intensity and cannot be controlled or disabled. In a previous work, we replaced the axially mounted H source of our ion mobility spectrometer with a commercially available X-ray source operated at low acceleration voltage of 4.5 kV to be applicable in most application without legal restrictions. However, the high penetration depth of the radiation together with the statistical behavior of the X-ray ionization process led to an increase of Fano noise and thus a limited signal-to-noise ratio. Therefore, the X-ray source is now mounted orthogonal to the drift tube in order to avoid Fano noise. Here, we compare the analytical performance of this orthogonal setup with the axially mounted X-ray source. The noise level is significantly reduced. This improves the signal-to-noise ratio from 700 with the axially placed source to more than 3000 with the orthogonally placed source, while the resolving power still remains at R = 100. Furthermore, typical limits of detection for some model substances in the low ppt range in positive and negative ion mode are given.
Ion mobility spectrometers (IMS) are devices for fast and very sensitive trace gas analysis. The measuring principle is based on an initial ionization process of the target analyte. Most IMS employ radioactive electron sources, such as Ni orH. These radioactive materials have the disadvantage of legal restrictions and the electron emission has a predetermined intensity and cannot be controlled or disabled. In this work, we replaced the H source of our IMS with 100 mm drift tube length with our nonradioactive electron source, which generates comparable spectra to theH source. An advantage of our emission current controlled nonradioactive electron source is that it can operate in a fast pulsed mode with high electron intensities. By optimizing the geometric parameters and developing fast control electronics, we can achieve very short electron emission pulses for ionization with high intensities and an adjustable pulse width of down to a few nanoseconds. This results in small ion packets at simultaneously high ion densities, which are subsequently separated in the drift tube. Normally, the required small ion packet is generated by a complex ion shutter mechanism. By omitting the additional reaction chamber, the ion packet can be generated directly at the beginning of the drift tube by our pulsed nonradioactive electron source with only slight reduction in resolving power. Thus, the complex and costly shutter mechanism and its electronics can also be omitted, which leads to a simple low-cost IMS-system with a pulsed nonradioactive electron source and a resolving power of 90.
Non-radioactive electron sources are of great interest in any application requiring the emission of electrons at atmospheric pressure, as they offer better control over emission parameters than radioactive electron sources and are not subject to legal restrictions. Recently, we published a simple electron source consisting only of a vacuum housing, a filament, and a single control grid. In this paper, we present improved control electronics that utilize this control grid in order to focus and defocus the electron beam, thus pulsing the electron emission at atmospheric pressure. This allows short emission pulses and excellent stability of the emitted electron current due to continuous control, both during pulsed and continuous operations. As an application example, this electron source is coupled to an ion mobility spectrometer. Here, the pulsed electron source allows experiments on gas phase ion chemistry (e.g., ion generation and recombination kinetics) and can even remove the need for a traditional ion shutter.
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