Cadmium oxide (CdO) semiconducting thin films have been obtained by sol-gel spin coating technique on glass substrates by varying the number of coatings. It has been found that the prepared thin films have exhibited very good structural, electrical, optical and surface morphological properties. The experimental results confirm that the number of coatings has a strong influence on the properties of these CdO films. The X-ray diffraction patterns of the films show well defined rock salt cubic structure. The films deposited at the optimised number of coatings exhibited a resistivity of 2?55610 23 V cm, a transmittance of 80% at 600 nm and a band gap of 2?28 eV with a good uniform smooth surface.
Highly transparent tin oxide thin films (SnO2) have been prepared using the sol–gel spin coating technique, optimising process parameters such as the solute concentration, spin rate and time of the turn table, film thickness (number of coatings) and heat treatment temperature. The X-ray diffraction (XRD) studies point to the polycrystalline structure of the developed films. The films deposited under optimum conditions are highly transparent in the visible region with a transmittance of 94% at 550 nm and have a resistivity of 3 × 10−2 Ωcm. The films have been obtained at a relatively low process temperature of 400°C.
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