Perovskite X-ray detectors have been demonstrated to be sensitive to soft X-rays (<80 keV) for potential medical imaging applications. However, developing X-ray detectors that are stable and sensitive to hard X-rays (80 to 120 keV) for practical medical imaging is highly desired. Here, a sensitive 2D fluorophenethylammonium lead iodide ((F-PEA) 2 PbI 4) perovskite single-crystal hard-X-ray detector from low-cost solution processes is reported. Dipole interaction of organic ions promotes the ordering of benzene rings as well as the supramolecular electrostatic interaction between electron-deficient F atoms with neighbor benzene rings. Supramolecular interactions serve as a supramolecular anchor to stabilize and tune the electronic properties of single crystals. The 2D (F-PEA) 2 PbI 4 perovskite single crystal exhibits an intrinsic property with record bulk resistivity of 1.36 × 10 12 Ω cm, which brings a low device noise for hard X-ray detection. Meanwhile, the ion-migration phenomenon is effectively suppressed, even under the large applied bias of 200 V, by blocking the ion migration paths after anchoring. Consequently, the (F-PEA) 2 PbI 4 single crystal detector yields a sensitivity of 3402 µC Gy −1 air cm −2 to 120 keV p hard X-rays with lowest detectable X-ray dose rate of 23 nGy air s −1 , outperforming the dominating CsI scintillator of commercial digital radiography systems by acquiring clear X-ray images under much lower dose rate. In addition, the detector shows high operation stability under extremely high-flux X-ray irradiation. Due to the unique penetration capability of X-ray, X-ray detectors have been widely used in the fields of medical imaging, security check, non-destructive product inspection, homeland defense, etc. [1-4] Semiconductor-based X-ray detector working in direct detection mode is attractive for these applications, since it
MXene is recognized as an ideal material for sensitive wearable strain sensor because of its unique advantages in conductivity, hydrophilicity and mechanical properties. However, conventional hydrogels sensors utilizing MXene as...
The ability to regulate the tilt angle of Si nanostructures is important for their applications in photoelectric devices. Herein we demonstrate a facile method to precisely regulate the tilt angle of nanocones with metal-assisted chemical etching (MaCE) in a one-step process based on the systematic investigation of the formation mechanism of the tilt angle. With Au nanohole arrays as templates, the tilt angles of Si nanocone arrays can be tuned from 69.2° to 88.6° by varying the composition of the etchant. When the Si nanocone arrays are the same height (2.2 μm), the reflectivity decreases with the decreasing of the tilt angle. When the tilt angle is 83.0°, the average reflectivity is lowered to 1.37% in the 250-1000 nm range. This method can be applied for fabrication over a large area (as large as 2 cm × 2 cm). This chemical method should be applicable to other Si nanostructures, which may promote the applications of MaCE in semiconductor manufacturing.
Surface-enhanced Raman scattering spectroscopy (SERS) is a nondestructive testing technique. To increase reproducibility of the SERS measurement is the key issue for improving the performance of SERS. In this article, we demonstrate an efficient method to improve the reproducibility, using confined silver nanoparticles (AgNPs) as a substrate. The AgNPs are formed uniformly on the tops of the prepared nanopillars by droplet-confined electroless deposition on the hydrophobic Si nanopillar arrays. The AgNPs present an excellent reproducibility in Raman measurement; the relative standard deviation is down to 3.40%. There exists a great linear correlation between the concentration of Rhodamine 6G (R6G) and the Raman intensity in the log-log plot; R is 0.998, indicating that this SERS substrate can be applied for the quantitative SERS analysis. Meanwhile, the minimum detection concentration is down to 10 M on the hydrophobic substrate, with R6G as a probe molecule.
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