In this paper, a design method of schematic mapping system based on inter-integrated circuit (I2C) bus and universal serial bus (USB) is introduced. The test principle which is adept by the system and the hardware design structure of the schematic mapping system are explained. Then this paper details hardware design structures of control-circuit, test-circuit and flexible needle bed. At the last, the system software structure and design are analyzed.
Abstract. Using for reference international advanced standard and combining with Chinese industry equipment technology characteristic, modernization equipment IETM development technology criterion was established. Current equipment IETM integration development flatform was developed handling IETM key technology for demand of equipment use and maintenance guarantee to improve efficiency of Chinese industry equipment use and maintenance guarantee.
In order to improve the fault diagnosis precision of electron system, a method based on wavelet packet transform and SVM was proposed. Fault diagnosis method based on SVM was researched on in this paper because of the complexity of electron system, difficulty of fault diagnosis method and special advantages of SVM. Wavelet packet transform is used to extract fault features from the signal of the circuit output voltage. The specific feature extraction method is introduced. Improved QPSO algorithm was proposed to improve the training speed and class precision of SVM. At last the method mentioned above was applied to a circuit. The result showed that this method was very good.
SVM Effect Factor AnalysisFactors that affect the performance of SVM include kernel function and its parameters and penalty coefficient C.
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