Design and demonstration of antenna-coupled Schottky diodes in a foundry complementary metal-oxide semiconductor technology for electronic detection of far-infrared radiation

Phase change materials, with more than one reflectance and resistance states, have been a subject of interest in the fields of phase change memories and nanophotonics. Although most current research focuses on rather complex phase change alloys, e.g. , Ge2Sb2Te5, recently, monatomic antimony thin films have aroused a lot of interest. One prominent attractive feature is its simplicity, giving fewer reliability issues like segregation and phase separation. However, phase transformation and crystallization properties of ultrathin Sb thin films must be understood to fully incorporate them into future memory and nanophotonics devices. Here, we studied the thickness-dependent crystallization behavior of pulsed laser-deposited ultrathin Sb thin films by employing dynamic ellipsometry. We show that the crystallization temperature and phase transformation speed of as-deposited amorphous Sb thin films are thickness-dependent and can be precisely tuned by controlling the film thickness. Thus, crystallization temperature tuning by thickness can be applied to future memory and nanophotonic devices. As a proof of principle, we designed a heterostructure device with three Sb layers of varying thicknesses with distinct crystallization temperatures. Measurements and simulation results show that it is possible to address these layers individually and produce distinct and multiple reflectance profiles in a single device. In addition, we show that the immiscible nature of Sb and GaSb could open up possible heterostructure device designs with high stability after melt-quench and increased crystallization temperature. Our results demonstrate that the thickness-dependent phase transformation and crystallization dynamics of ultrathin Sb thin films have attractive features for future memory and nanophotonic devices.

We explore here the decisive role of film thickness on Casimir and electrostatic forces from topological insulating Bi 2 Se 3 films. The forces were measured for the Au-Bi 2 Se 3 system under ambient conditions to simulate realistic applications. It is shown that the electrostatic forces associated with a nonzero contact potential of V o ∼ 200 mV played a dominant role, and could not be compensated for thinner films ( 20 nm thick). However, for thicker films the measured force, after voltage compensation, started to approach the genuine Casimir force in very good agreement with Lifshitz theory. Our results point out that any gradual deviation from theory for thinner films underlies the presence of strong electrostatic effects.

Strain engineering as a method to control functional properties has seen in the last decades a surge of interest. Heterostructures comprising 2D-materials and containing van der Waals(-like) gaps were considered unsuitable for strain engineering. However, recent work on heterostructures based on Bi 2 Te 3 , Sb 2 Te 3 , and GeTe showed the potential of a different type of strain engineering due to long-range mutual straining. Still, a comprehensive understanding of the strain relaxation mechanism in these telluride heterostructures is lacking due to limitations of the earlier analyses performed. Here, we present a detailed study of strain in two-dimensional (2D/2D) and mixed dimensional (2D/3D) systems derived from mica/Bi 2 Te 3 , Sb 2 Te 3 /Bi 2 Te 3 , and Bi 2 Te 3 /GeTe heterostructures, respectively. We first clearly show the fast relaxation process in the mica/Bi 2 Te 3 system where the strain was generally transferred and confined up to the second or third van der Waals block and then abruptly relaxed. Then we show, using three independent techniques, that the long-range exponentially decaying strain in GeTe and Sb 2 Te 3 grown on the relaxed Bi 2 Te 3 and Bi 2 Te 3 on relaxed Sb 2 Te 3 as directly observed at the growth surface is still present within these three different top layers a long time after growth. The observed behavior points at immediate strain relaxation by plastic deformation without any later relaxation and rules out an elastic (energy minimization) model as was proposed recently. Our work advances the understanding of strain tuning in textured heterostructures or superlattices governed by anisotropic bonding.

Integration of the prototypical GeSbTe (GST) ternary alloys, especially on the GeTe-Sb2Te3 tie-line, into non-volatile memory and nanophotonic devices is a relatively mature field of study. Nevertheless, the search for the next best active material with outstanding properties is still ongoing. This search is relatively crucial for embedded memory applications where the crystallization temperature of the active material has to be higher to surpass the soldering threshold. Increasing the Ge content in the GST alloys seems promising due to the associated higher crystallization temperatures. However, homogeneous Ge-rich GST in the as-deposited condition is thermodynamically unstable, and phase separation upon annealing is unavoidable. This phase separation reduces endurance and is detrimental in fully integrating the alloys into active memory devices. This work investigated the phase separation of Ge-rich GST alloys, specifically Ge5Sb2Te3 or GST523, into multiple (meta)stable phases at different length scales in melt-quenched bulk and annealed thin film. Electron microscopy-based techniques were used in our work for chemical mapping and elemental composition analysis to show the formation of multiple phases. Our results show the formation of alloys such as GST213 and GST324 in all length scales. Furthermore, the alloy compositions and the observed phase separation pathways agree to a large extent with theoretical results from density functional theory calculations.

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