Bursts of coherent synchrotron radiation at far-infrared and millimeter wavelengths have been observed at several storage rings. A microbunching instability has been proposed as the source for the bursts. However, the microbunching mechanism has yet to be elucidated. We provide the first evidence that the bursts are due to a microbunching instability driven by the emission of synchrotron radiation in the bunch. Observations made at the Advanced Light Source are consistent with the values predicted by the proposed microbunching model. These results demonstrate a new instability regime for high energy synchrotron radiation sources and could impact the design of future sources.
Frequency map analysis was first used for the dynamical study of numerical simulations of physical systems (solar system, galaxies, particle accelerators). Here it is applied directly to the experimental results obtained at the Advanced Light Source. For the first time, the network of coupling resonances is clearly visible in an experiment, in a similar way as in the numerical simulation. Excellent agreement between numerical and experimental results leads us to propose this technique as a tool for improving numerical models and actual behavior of particle accelerators. Moreover, it provides a model-independent diagnostic for the evaluation of the dynamical properties of the beam.
A new X-ray undulator has been designed and constructed which produces linearly polarized X-rays in which the plane of polarization can be oriented to a user selectable angle, from horizontal to vertical. Based on the Apple-II elliptically polarizing undulator (EPU), the undulator rotates the angle of the linear polarization by a simple longitudinal motion of the undulator magnets. Combined with the circular and elliptical polarization capabilities of the EPU operating in the standard mode, this new undulator produces soft X-ray radiation with versatile polarization control. This paper describes the magnetic structure of the device and presents an analysis of the magnetic ®eld with varying undulator parameters. The variable linear polarization capability is then exhibited by measuring the X-ray absorption spectrum of an oriented polytetra¯uoroethylene thin ®lm. This experiment, which measures the linear dichroism of the sample at two peaks near the C 1s absorption edge, demonstrates the continuous polarization rotation capabilities of the undulator.
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