We demonstrate that, by using a concentric device geometry, the dopant density and the bulk charge-carrier mobility can simultaneously be estimated from the transfer characteristics of a single disordered organic transistor. The technique has been applied to determine the relation between the mobility and the charge density in solution-processed poly(2,5-thienylene vinylene) and poly(3-hexyl thiophene) thin-film field-effect transistors. The observation that doping due to air exposure takes place already in the dark, demonstrates that photoinduced oxygen doping is not the complete picture.
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We investigate low frequency conductivity noise in the drain-source channel of organic material field-effect transistors by measuring the spectra of current fluctuations for several values of the gate voltage V gs and drain voltage V ds and find that it is 1/f . The samples are biased in the ohmic range of the applied V ds . The relative current 1/f noise is inversely proportional to the charge carrier numbers N generated by illumination or by varying the gate-source voltage. Hooge's empirical relation for the 1/f noise is validated for these organic semiconductors with an ␣Х0.01 for poly-thienylene vinylene and about 100 for pentacene thin film transistors. From geometry dependence of the noise we conclude that series resistance can be ignored for poly-thienylene vinylene field-effect transistors. However, some pentacene samples suffer from a noisy series resistance to the channel resistance. From the 1/f noise dependence on geometry and gate voltage bias we conclude that it can be used as a diagnostic tool for device quality assessment.
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