The emission of laser induced X-rays from materials processing ultra-short pulsed laser systems was measured. The absolute spectral photon fluence was determined using a thermoluminescence detector based few-channel spectrometer. The spectra at 10 cm from the laser focus were in the energy region between 2 and 25 keV with mean energies of ~4-6 keV (when weighted by fluence or directional dose equivalent) and up to 13 keV (when weighted by ambient dose equivalent). The operational quantities, H·'(0.07), H·'(3) and H·*(10), were determined to be in the order of 1600-7300, 16-71 and 1-4 mSv per hour processing time, respectively, depending on the material and condition of the workpiece. The dose contribution due to photons above 30 keV was for all quantities negligible, i.e. below 10-3.
Abstract. Laser materials processing of workpieces using ultra-short pulsed lasers can lead to unwanted X-ray emission. Their dose rate and spectral distribution have been precisely determined. The measurements were carried out using a thermoluminescence detector (TLD)-based spectrometer in which 30 TLD planes are arranged one behind the other, the first 10 layers made of polymethyl methacrylate, while the remaining 20 layers are interspaced by absorbers with, from the front to the back, increasing atomic charge and thickness. The penetration depth of the radiation into the spectrometer depends on its energy, so that the energy-resolved spectrum of the radiation can be calculated from the TLD dose values by means of mathematical methods (Bayesian deconvolution). The evaluation process also takes into account both the uncertainties of all input quantities and the possibility of adopting different models for the spectrum form. This allowed the resulting spectra to be associated with their realistic uncertainty. The measurements are traceable to the Système international d'unités (SI), i.e. the International System of Units. The results not only provide manufacturers and users of ultra-short pulsed lasers with important information on the design of the machines with regard to radiation protection, but were also included in the recently concluded legislative procedure in the field of radiation protection in Germany.
Ultrashort pulse laser processing can result in the secondary generation of unwanted X-rays if a critical laser irradiance of about 1013 W cm−2 is exceeded. Spectral X-ray emissions were investigated during the processing of tungsten and steel using three complementary spectrometers (based on CdTe and silicon drift detectors) simultaneously for the identification of a worst-case spectral scenario. Therefore, maximum X-ray photon energies were determined, and corresponding dose equivalent rates were calculated. An ultrashort pulse laser workstation with a pulse duration of 274 fs, a center wavelength of 1030 nm, pulse repetition rates between 50 kHz and 200 kHz, and a Gaussian laser beam focused to a spot diameter of 33 μm was employed in a single pulse and burst laser operation mode. Different combinations of laser pulse energy and repetition rate were utilized, keeping the average laser power constant close to the maximum power of 20 W. Peak irradiances I0 ranging from 7.3 × 1013 W cm−2 up to 3.0 × 1014 W cm−2 were used. The X-ray dose equivalent rate increases for lower repetition rates and higher pulse energy if a constant average power is used. Laser processing with burst mode significantly increases the dose rates and the X-ray photon energies. A maximum X-ray photon energy of about 40 keV was observed for burst mode processing of tungsten with a repetition rate of 50 kHz and a peak irradiance of 3 × 1014 W cm−2.
Interactions between ultrashort laser pulses with intensities larger than 1013 W/cm2 and solids during material processing can lead to the emission of X-rays with photon energies above 5 keV, causing radiation hazards to operators. A framework for inspecting X-ray emission hazards during laser material processing has yet to be developed. One requirement for conducting radiation protection inspections is using a reference scenario, i.e., laser settings and process parameters that will lead to an almost constant and high level of X-ray emissions. To study the feasibility of setting up a reference scenario in practice, ambient dose rates and photon energies were measured using traceable measurement equipment in an industrial setting at SCHOTT AG. Ultrashort pulsed (USP) lasers with a maximum average power of 220 W provided the opportunity to measure X-ray emissions at laser peak intensities of up to 3.3 × 1015 W/cm2 at pulse durations of ~1 ps. The results indicate that increasing the laser peak intensity is insufficient to generate high dose rates. The investigations were affected by various constraints which prevented measuring high ambient dose rates. In this work, a list of issues which may be encountered when performing measurements at USP-laser machines in industrial settings is identified.
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