Sub-threshold circuits have emerged as a strong candidate for use in future energy-constrained applications. In a nonhomogeneous design paradigm containing both sub-threshold and high power-density super-threshold blocks, it becomes imperative to examine the thermal effects on sub-threshold operation. In this paper, we investigate the thermal impact on sub-threshold current, delay and energy and develop analytical models of the same. Unlike super-threshold, the sub-threshold I ON increases exponentially with temperature while the I ON -to-I OFF ratio degrades by 0.52%ºC. While delay decreases, energy increases with temperature due to relative increase in leakage power at the higher temperatures. Studies performed on noise-margins, current/delay variability and sub-V th interconnects suggest that sub-V th circuits can retain {power, delay, energy} optimality over a relatively high temperature range of 25-75ºC.
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