Two new Standard Reference Materials (SRMs), SRM 2786 Fine Particulate Matter (<4 μm) and SRM 2787 Fine Particulate Matter (<10 μm) have been developed in support of the US Environmental Protection Agency's National Ambient Air Quality Standards for particulate matter (PM). These materials have been characterized for the mass fractions of selected polycyclic aromatic hydrocarbons (PAHs), nitrated PAHs, brominated diphenyl ether (BDE) congeners, hexabromocyclododecane (HBCD) isomers, sugars, polychlorinated dibenzo-p-dioxin (PCDD) and dibenzofuran (PCDF) congeners, and inorganic constituents, as well as particle-size characteristics. These materials are the first Certified Reference Materials available to support measurements of both organic and inorganic constituents in fine PM. In addition, values for PAHs are available for RM 8785 Air Particulate Matter on Filter Media. As such, these SRMs will be useful as quality control samples for ensuring compatibility of results among PM monitoring studies and will fill a void to assess the accuracy of analytical methods used in these studies. Graphical Abstract Removal of PM from filter for the preparation of SRM 2786 Fine Particulate Matter.
Four new Standard Reference Materials (SRMs) have been developed to assist in the quality assurance of chemical contaminant measurements required for human biomonitoring studies, SRM 1953 Organic Contaminants in Non-Fortified Human Milk, SRM 1954 Organic Contaminants in Fortified Human Milk, SRM 1957 Organic Contaminants in Non-Fortified Human Serum, and SRM 1958 Organic Contaminants in Fortified Human Serum. These materials were developed as part of a collaboration between the National Institute of Standards and Technology (NIST) and the Centers for Disease Control and Prevention (CDC) with both agencies contributing data used in the certification of mass fraction values for a wide range of organic contaminants including polychlorinated biphenyl (PCB) congeners, chlorinated pesticides, polybrominated diphenyl ether (PBDE) congeners, and polychlorinated dibenzo-p-dioxin (PCDD) and dibenzofuran (PCDF) congeners. The certified mass fractions of the organic contaminants in unfortified samples, SRM 1953 and SRM 1957, ranged from 12 ng/kg to 2200 ng/kg with the exception of 4,4'-DDE in SRM 1953 at 7400 ng/kg with expanded uncertainties generally <14 %. This agreement suggests that there were no significant biases existing among the multiple methods used for analysis.
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Fundamental limits for the calculation of scattering corrections within X-ray
computed tomography (CT) are found within the independent atom approximation from an
analysis of the cross sections, CT geometry, and the Nyquist sampling theorem,
suggesting large reductions in computational time compared to existing methods. By
modifying the scatter by less than 1 %, it is possible to treat some of the elastic
scattering in the forward direction as inelastic to achieve a smoother elastic
scattering distribution. We present an analysis showing that the number of samples
required for the smoother distribution can be greatly reduced. We show that fixed
forced detection can be used with many fewer points for inelastic scattering, but
that for pure elastic scattering, a standard Monte Carlo calculation is preferred.
We use smoothing for both elastic and inelastic scattering because the intrinsic
angular resolution is much poorer than can be achieved for projective tomography.
Representative numerical examples are given.
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