Nanoscale corrugation is a fundamental property of graphene arising from its low-dimensional nature. It places a fundamental limit to the conductivity of graphene and influences its properties. However the degree of the influence of the corrugation has not been well established because of the little knowledge about its spectrum in suspended graphene. We present a transmission electron microscopy technique that enables us to measure the average corrugation height and length. We applied the technique also to measure the temperature dependence of the corrugation. The difference in corrugation between suspended and supported graphene has been illustrated.
Thermal reduction in molecular hydrogen of the graphene oxide films has been studied by X-ray photoelectron spectroscopy using synchrotron radiation. The restoration process was revealed to be accompanied by hydrogenation due to collisionally induced interaction of molecular hydrogen with carbon atoms. One side hydrogenated graphene films consisting of 20 μm one monolayer flakes were fabricated on SiO2/Si surface with hydrogen concentration as far as 40 at. %, at which the 0.3 eV bandgap opening was observed. It was shown that both H-coverage and bandgap width of the films can be controlled by varying the temperature of the heat treatment.
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