A model SMD test‐piece has been developed which permits mechanical stressing of a solder joint in a similar mode to that occurring in the process of thermal fatigue. The failure mechanisms in the 60Sn40Pb alloy studied have been in agreement with those frequently observed in thermal fatigue. Further, the fatigue life of model joints was found to increase with increasing solder volume whilst, upon ageing at room temperature, fatigue resistance decreased. These effects were attributed to microstructural changes occurring within the solder.
There is continuous pressure in the electronics industry towards miniaturisation. This has led to the development of fine pitch soldered devices, and this paper considers the concept of solder creams which use a restrictive flux system as suitable for this work, rather than those that employ finer powder. It is shown that the latter type of solder cream must use metal powders with a higher oxide content which will require the cream to contain a more active flux.
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